Centre des Publications Scientifiques


Electrical characterisation of thin silicon layers by light beam induced current and internal quantum efficiency measurements

www.univ-soukahras.dz/fr/publication/article/496

Yassine Sayad, S. Amtablian, A. Kaminski and D. Blanc (2009) Electrical characterisation of thin silicon layers by light beam induced current and internal quantum efficiency measurements. Materials Science and Engineering B , 165(1-2), 67-70, Elsevier

Télécharger l'article